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-EWEDT.1 <br />ACDEH, August 2003 E C 17 2 013 J --�� <br />age of <br />S. SECONDAItY PI F, TEST <br />Test Method Developed By: ❑Piping M$nttiaCpu er <br />D Other (,Speco DEPA a� ginesr <br />IeST.Method Used: Ii Pressure <br />Vacuum 0 Hyd rostatia <br />Q btiter (Spec�J <br />Test EKuipnuen[ Uscd:U-15 PSI Crauge <br />Equipment Resolution: <br />piping Euu # "Cj� Pipiteq Rub <br />S Material: Pipiag Run # ft' g Run r#4..Q l <br />Piping ManeaCturer_ SCt` •. ' <br />Piping Diametsr: t tt <br />LeuWh'of Piping Run <br />Product Store& <br />Method and bion of <br />�i <br />I -rain isolation: �► .5 <br />wait time between applying <br />Pf#SSttiee/vBcuumhvatar and <br />Startin test <br />Test Start Time: <br />Initial Reading (R�: W is <br />Test End Time: ` t <br />FIRW Reacting <br />Test Dmatioou: <br />Cbange W Reading (lF-,R,): <br />Pass/Fail Threshold. or <br />CntErla; '�'O <br />CO>ailtilept9 — include !n ormation on r /►`s marls rlor to teathn and recommended ollow-uor <br />1 led tests ------------- <br />i <br />TT/60 3JCd 000A SV9 3N0 d <br />9L9LEE860Z 6b:bT ETOZ/LT/ZT <br />