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1 <br />Page No: 3 <br />TABLE V-2 <br />GC and GC/MS MAINTENANCE <br />Project Plan <br />Revision 6 <br />1/8/1988 <br />Page 33 of 37 <br />SCHEDULE <br />Type of <br />Frequency <br />Parameters <br />STD REF GEN Proc. <br />Instrument <br />of check <br />to be checked <br />s Li i <br />When <br />Used <br />Sip—tum <br />Rep ace <br />septum <br />Chromato- <br />graphs <br />graphs <br />Yearly <br />Perform work <br />by a ali- <br />service <br />ventive <br />fied <br />Maintenance <br />represenative <br />or staff <br />member quali- <br />fied through <br />specialized <br />training <br />2) <br />Gas Liquid <br />When <br />Used <br />Resolution, <br />A re(n,lrly used <br />Chromatographs <br />sensitivity,, <br />star <br />Detection Systems <br />reproducibility, <br />retention time <br />& noise level <br />A) <br />Electron <br />When <br />Used <br />1. Same as FID <br />Same as FID Same as FID <br />Capture <br />(EC) <br />2e Standing current <br />1 <br />B) <br />Flame <br />When <br />Used <br />Resolution, <br />A regularly Compare <br />' <br />Ionization <br />sensitivity, <br />used standard against <br />reproduci- <br />previous runs <br />bility, <br />retention time <br />& noise level <br />Same FID <br />C) <br />Coulson & <br />When <br />Used <br />Same as FID <br />Same as FID as <br />Hall Electo- <br />lytic Con- <br />ductivity <br />39 <br />