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GEOUS®Well Purging Form I <br /> DATE <br />' <br /> CLIENT U SAMPLER <br /> ppPAOJWTr7 -F7 <br /> Gu` <br /> TURF— <br /> WELL OBSERVATIONS <br /> WELL CASING AND LID NTACT-DAMAGED-MOVED-NONE LOCKED `{YESf NO KEY NO <br />' STICKUP HEIGHT <br /> FT-M <br /> WELL DIAM ETER 20-C-e'-OTTER <br /> MEASURING POINT TIC-TOC-GAS-OTI+ TOC-TIC DIFFERENCE IN-CM <br />' VAPOR READINGS(1g)ID D DEVI E <br /> BACKGROUND INSIDE WELL CASING _ <br /> 22 <br />' NAPL LAYER OBSERVED FLT-SNK NO SAMPLED' YES-NO THICKNESS. IN-CM <br /> PURGING CALCULATIONS <br /> gU DEPTH TO WELL BOTTOM FT-M <br />' (B) DEPTH TO WATER .i¢ Fr-M MEASURED <br /> C <br /> (C} WATER COLUMN HEIGHT(A-3) I 'M Well Faotw-0 Dov (Well Diameter in inoses)= <br />' <br /> WELL DIAMETER FACTOR PPF-LPM <br /> (D) (r-010. 4--063 8' a 1 47, 8'=2151 GPF) <br /> (E) ONE WELL VOLUME(C x D) 3'`' *L (r-20. 4'-81, b'a v 8.2, 8'=32 4 LPM) <br /> I (Fl VOLUMES TO BE PURGED �! _ _ <br /> (G) TOTAL VOLUME TO BE PURGED (E x F) S-� ( , o�� <br /> _ PURGING INFORMATION <br /> PURGING METHOD BAILER _ NI U OTHER <br /> DEVICEDESCRIPTiON �G ' 'i( :tom _ 1 , <br /> PUMP/BAILER INTAKE DEPTH TO ScFtEENNVELL-WATER SURFACE <br /> PURGE WATER DISCHARGED-TREATED- OR STORED 1 TAN r DRUMS NO <br /> I FIELD PARAMETERS MEASURED IN FLOW THRU CHAMBER OPEN CONTAINER�� <br /> FIELD MEASUREMENTS <br /> TIME DTE TTH PUpp,Rdik TURBID COMMENTS <br /> 4� <br />' (WFAT� (GPM-LPM) -iTY C I rl�} jp o)-�C <br /> Pd� L v �7, f7 L� l/CCJ 6it(V_ , cC l? <br /> 7+r4� C� ICK e J� <br /> o5 3 L I i I 5 1 1 CSs fr <br /> �2{ '-1 7,�L '100 <br /> -RELDMEASUREMEWCCOM `*44 <br />' MTP-Temperature MCL-Calor MDO-Dissolved Oxygen M01 -07W in Well <br /> MSC-Spedflc Conductance MPH-pH M01 -Other M102-DTW In Weil <br /> MPD-Photolonzer(s g ,HNu) MEH-Eh M02-Other MD3-DTW In Well <br /> MFD-Flame ionizer(e g, OVA) MAL-Alkalinity M03-Other M04-DTW In Well <br /> G071003COPYRIGHT 01981 by Ray F Wleemn im <br />