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GEOUS O Wel! Purging Form y� <br /> COMPANY SAMPLE NO <br /> CLIENT S � �� DATE <br /> PROJECT SAMPLER f <br /> SITE SIGNATURE <br /> WELL OBSERVATIONS <br /> WELL CASING AND LTDI(INT�-DAMAGED-MOVED-NONE LOCKED 5ES <br /> NO KEY NO <br /> WELL DIAMETER 2' 4'-ems-8'-OTHER STICKUP HEIGHT FT-M <br /> IMEASURING POINT TIC OC GRS-OTH TOC-TIC DIFFERENCE IN-CM <br /> VAPOR READINGS PID-FID DEVICE. <br /> BACKGROUND INSIDE WELL CASING <br /> NAPL LAYER OBSERVED FLT-SN ON/ SAMPLED YES-NO THICKNESS IN-CM <br /> PURGING CALCULATIONS <br /> (A) DEPTH TO WELL BOTTOM -? FT-M MEASURED-RECORDED PREVIOUSLY <br /> (B) DEPTH TO WATER. 5'-122 <br /> FT-M TIME MEASURED (2 ';:Z 7 <br /> (C) WATER COLUMN HEIGHT(A-8) FT_M Well Factor a 0 041 (Well Diameter in Inches)2 <br /> (D) WELL DIAMETER FACTOR GPF LPM (2'-018, 4'a 0 BS; 8'a 1 47, 8'=2 81 GPF) <br /> (E) ONE WELL VOLUME(C x p) GAL-L (2'-2 0, 4' a 8 1, W a 182, e'a 82 4 LPM) <br /> I (F7 VOLUMES TO BE PURGED- <br /> (G) <br /> URGED(G) TOTAL VOLUME TO BE PURGED (E x F) GAL-L <br /> PURGING INFORMATION <br /> PURGING METHOD BAILER US PUMP-CEM PUMP-OTHER. <br /> DEVICE DESCRIPTION TP_ iv? <br /> PUMP/BAII.ER INTAKE DEPTH �BOTTOM-SCREENNYELL-WATER SURFACE <br /> PURGE WATER Disaq RGED-TREATED. ONS STOREDII KS-DRUMS NO <br /> fFIELD PARAMETERS MEASURED IN FLOW THRU CHAMBE �COL <br /> DEPTH PURGE FIELD MEASUREMENTS <br /> TIME TO TURBID <br /> RAM— COMMENTS <br /> M) (GPM.LPM) -IN fen <br /> �i of- 611M 2-,1,3 3 <br /> I ! 1 6. 2 -6 312, <br /> 1 z� g � 3 z°•� o <br /> 122-2 <br /> 7 REMMEASURIMEWCCOM <br /> MTP-Temperature MCL-Color MDQ-Dhmohmd Oxygen MD1 -DTW In Well <br /> MSC-SpecMlc Conductance MPH-pH M01 -Other MD2-DTW In Well <br /> MPD-Photoionizer(e g,HNu) MEH-Eh M02-Other MD3-DTW In Well <br /> MFD-Flame ionizer(e 9. OVA) MAL-Alkalinity M03-Other M04-DTW In Well <br /> COPYRIGHT a IM by Roy F Wedon,Inc G071093 <br />