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k'q KLEINFELDER <br /> 3. Water level measurements are made using a conductivity-based water-level meter. <br /> Depth-to-water is generally measured from a surveyed mark on the north rim of the PVC <br /> well casing. <br /> The water level measurements are converted to elevations using the surveyed casing elevations. <br /> A4.2 Groundwater Sampling <br /> Groundwater samples are collected from the monitoring wells at the site. The sampling protocol <br /> for each well is as follows: <br /> 1. Down-well equipment (pumps, bailers, etc.) is decontaminated by steam cleaning, or by <br /> scrubbing in a trisodium-phosphate wash followed by a distilled water rinse, prior to use <br /> in each well. Bailer cord is replaced prior to use in each well. <br /> 2. The depth-to-water is measured using a conductivity-based water-level meter. <br /> I The volume of water standing in the well is calculated by subtracting the depth-to-water <br /> measurement from the depth of the well and multiplying by the appropriate conversion <br /> factor(3.14 *radius'). <br /> 4. Three to five well volumes of water are purged from each well using a submersible <br /> pump, bladder pump,or Teflon bailer. <br /> S. Physical parameters (pH, electrical conductivity, and temperature) are monitored for <br /> stability during purging. The physical parameter measurements are recorded on purge- <br /> and-sample logs, along with the time and volume of water purged at each measurement. <br /> 6. Samples are collected with a disposable bailer or bladder pump into appropriately <br /> prepared bottles provided by the analytical laboratory. <br /> 7. Samples for metals analysis are usually filtered in the field at the time of collection. <br /> 8. Samples are immediately labeled and placed in an iced sample container. At the end of <br /> the day, the samples are delivered to the analytical laboratory under chain-of-custody <br /> control. Sample handling is described in more detail in Section A-2.4. <br /> 20-2245-32.E01/2017R720 Page A-5 <br /> © 1997,Kleinfelder,Inc. November 18, 1997 <br />