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Page 2 <br /> Determination of Sheen <br /> After depth to water and free product measurements are performed, <br /> a test for the presence of sheen is conducted. A transparent <br /> bailer is lowered into the well in a manner such that only part of <br /> the bailer is submerged. The bailer is withdrawn from the well and <br /> the surface of the water in the bailer is observed for the presence <br /> of sheen as determined by the presence of iridescence or emul- <br /> sification. Presence of sheen is not investigated if it is <br /> determined that free product is present in the well. <br /> Total Well Depth Measurement <br /> Once the test for sheen presence has been conducted, the total <br /> depth of the well is measured. Total well depth is determined by <br /> measuring from the reference elevation described in the section for <br /> Depth to Water level Measurement, above, to the depth at which <br /> tension in the tape measure to which the electric probe is attached <br /> or the steel tape to which the yardstick is attached becomes slack. <br /> Total well depth measurements are made to the nearest 0. 05 feet. <br /> Well Purging <br /> In order to obtain a representative sample of the water in the <br /> aquifer being sampled, stagnant water in the well casing must be <br /> removed to permit well recharge with non-stagnant aquifer water. <br /> The removal of stagnant water will be accomplished by the removal <br /> of the water to the surface where it will be either disposed of or <br /> stored for future disposal. <br /> The purging rate used at a particular monitoring well will depend <br /> on the expected or known hydraulic yield of the well. <br /> In moderate to high yield formation wells the purging device will <br /> be placed near the top of the screened interval of the well to <br /> ensure that non-stagnant formation water will move upward in the <br /> screened interval. When purging low yield formation wells, water <br /> will be removed from the bottom of the screened interval. <br /> when purging low-yield wells (wells which yield less than 3 casing <br /> volumes) , the wells will be purged to dryness once. As soon as the <br /> well has recovered to a volume sufficient for sampling, samples <br /> will be collected. At no time will a well be purged to dryness if <br /> the rate of recharge is such that formation water will cascade down <br /> the sides of the casing. <br /> During purging operations, the yield parameters of pH, temperature, <br /> electrical conductivity (EC) and turbidity will be monitored in the <br /> purged water. <br />