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L� <br /> g 'f.� <br /> 1 WE <br /> E <br /> wt <br /> descriptions from each soil type encountered cn the drilling logs <br /> (Appendix I). <br /> Field analysis of soil samp]as using the FID recorded the <br /> highest organic vapor readings ,.n samples from monitoring well <br /> borings 1 and 4. Similarly fi,_ld inspection of samples detected <br /> the strongest product odors from these two wells with slight <br /> odors noted at increasing depths in well borings at greater <br /> distances. <br /> Selected soil samples were laboratory analyzed to determine <br /> R-nzene, Toluene, Xylene and total volatile hydrocarbon concentr- <br /> ations. Analyses were performed by purge and trap gas chromato- <br /> graphy, EPA Method 5030, with flame ionization detection and <br /> ph,.toionization detection as per EPA Methods 8015 and 8020. The <br /> laboratory test results are presented in Appendix III. The soil <br /> sample collected at a depth of 19 feet in well bore 3 contained <br /> t+b <br /> the highest contaminant level; 75 mg/kg (ppm) total volatile <br /> I «r' hydrocarbons. Concentrations for. samples from well borings 9, 2 <br /> and 4 were 68 ppm (at 25 ft. ) , 33 ppm (at 24 ft. ), and 22 ppm (at <br /> 14 ft. ) re!•.�ectively. <br /> r <br /> GROUNDWATER MONITORING <br /> i <br /> Periodic monitoring of wells at the site has continued <br /> since their initial installations in May 1986 through August 1986 <br /> s7 (Table 1). Groundwater monitoring to determine the presence of <br /> free product and the depth of the liquid interface wap conducted <br /> in accordance with Groundwater Technology's Standard Operating <br /> Procedure 8 (Appendix II). The surveyed well head elevations <br /> and the monitoring data for August 19, 1986 allowed the con- <br /> struction of a groundwater gradient map (Figure 8). Hater table <br /> elevation hyJrographs for 8 of the groundwater monitoring wells <br /> in the study area were nrafted through the August 25, 1986 <br /> -`�-' monitoring (Appendix TV). Changes in product thickness with time <br /> ib <br />