Laserfiche WebLink
7 . After the analvsis of -en samples -he Low standard, "Siddle <br /> verification standard and sand blanicc -are re-analvzed. The standards <br /> are used to monitor instrument trift and should be within 20 % of <br /> the known concentration. Some t.-peof corrective action must be <br /> taken before further analyses if anv value varies more then 50% tm <br /> the initial QC checks . <br /> 8. Ten percent of the samples reported by XRF should be verified by AA <br /> or ICP methodology. <br /> 9. One of the XRF samples with an analyte concentration near the <br /> action level should be analyzed seven times to determine <br /> analytical precision. Sampie dups and field dups should also be <br /> analyzed every 10th sample. <br /> "ANALYSIS ORDER" 1 L-STD 6 L-STD <br /> 2 M-STD 7 M-STD <br /> 3 S-BLK 8 S-BLK <br /> 4 E-STD 5. 4a 9 SAMPLES 11-20 <br /> 5 SAMPLES 1-10 10 QC SAMPLES <br /> IV. PERFORMANCE SAMPLE CHECK (OPTIONAL) <br /> For all uses of the XRF, the performance standard check, if analyzed, must <br /> be within 100 % of known concentration. <br /> * The performance standard check, if analyzed, should be within 30 $ <br /> of the known concentration to be considered as not needing additional <br /> qualification. <br /> V. ANALYTICAL. PRECISION (OPTIONAL) <br /> For all uses of the XRF, replicate analysis to determine analytical <br /> precision, if done, must have a variance of no more then 50 8. <br /> * Replicate analysis to determine analytical precision, if done, <br /> should have a variance of no more then 20 % . <br /> VI. DETECTION LIMIT STUDY <br /> AhWlyze_ a-sample near your- action level_- a minimum of,, seven. <br /> tlj$es: Calculatethe standard deviatfon-; then multiply,`by -T. <br /> MDL =•3 (SD) . For more detail see section 7 . 4.2 and 9. 0 in--the- <br /> ERT SOP. <br /> 4 <br />