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PR0535342
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PR0535342
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Last modified
7/29/2020 5:32:38 PM
Creation date
7/22/2020 8:36:59 AM
Metadata
Fields
Template:
EHD - Public
ProgramCode
4700 - Waste Tire Program
RECORD_ID
PR0535342
PE
4740
FACILITY_ID
FA0020390
FACILITY_NAME
RENEWED RESOURCES CORP
STREET_NUMBER
29425
Direction
S
STREET_NAME
MACARTHUR
STREET_TYPE
RD
City
TRACY
Zip
95376
APN
25312026
CURRENT_STATUS
02
SITE_LOCATION
29425 S MACARTHUR RD
P_LOCATION
99
P_DISTRICT
005
QC Status
Approved
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SJGOV\gmartinez
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EHD - Public
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METHOD 6200 <br /> FIELD PORTABLE X-RAY FLUORESCENCE SPECTROMETRY FOR THE <br /> DETERMINATION OF ELEMENTAL CONCENTRATIONS IN SOIL AND SEDIMENT <br /> 1.0 SCOPE AND APPLICATION <br /> 1.1 This method is applicable to the in situ and intrusive analysis of the 26 analytes listed <br /> in Table 1 for soil and sediment samples. Some common elements are not listed in Table 1 because <br /> they are considered "light" elements that cannot be detected by field portable x-ray fluorescence <br /> (FPXRF). They are: lithium, beryllium, sodium, magnesium, aluminum, silicon, and phosphorus. <br /> Most of the analytes listed in Table 1 are of environmental concern, while a few others have <br /> interference effects or change the elemental composition of the matrix, affecting quantitation of the <br /> analytes of interest. Generally elements of atomic number 16 or greater can be detected and <br /> quantitated by FPXRF. <br /> 1.2 Detection limits depend on several factors, the analyte of interest, the type of detector <br /> used, the type of excitation source, the strength of the excitation source, count times used to <br /> irradiate the sample, physical matrix effects, chemical matrix effects, and interelement spectral <br /> interferences. General instrument detection limits for analytes of interest in environmental <br /> applications are shown in Table 1. These detection limits apply to a clean matrix of quartz sand <br /> (silicon dioxide) free of interelement spectral interferences using long (600-second) count times. <br /> These detection limits are given for guidance only and will vary depending on the sample matrix, <br /> which instrument is used, and operating conditions. A discussion of field performance-based <br /> detection limits is presented in Section 13.4 of this method. The clean matrix and field performance- <br /> based detection limits should be used for general planning purposes, and a third detection limit <br /> discussed, based on the standard deviation around single measurements, should be used in <br /> assessing data quality. This detection limit is discussed in Sections 9.7 and 11.3. <br /> 1.3 Use of this method is restricted to personnel either trained and knowledgeable in the <br /> operation of an XRF instrument or under the supervision of a trained and knowledgeable individual. <br /> This method is a screening method to be used with confirmatory analysis using EPA-approved <br /> methods. This method's main strength is as a rapid field screening procedure. The method <br /> detection limits (MDL) of FPXRF are above the toxicity characteristic regulatory level for most RCRA <br /> analytes. If the precision, accuracy, and detection limits of FPXRF meet the data quality objectives <br /> (DQOs) of your project, then XRF is a fast, powerful, cost effective technology for site <br /> characterization. <br /> 2.0 SUMMARY OF METHOD <br /> 2.1 The FPXRF technologies described in this method use sealed radioisotope sources to <br /> irradiate samples with x-rays. X-ray tubes are used to irradiate samples in the laboratory and are <br /> beginning to be incorporated into field portable instruments. When a sample is irradiated with x-rays, <br /> the source x-rays may undergo either scattering or absorption by sample atoms. This later process <br /> is known as the photoelectric effect. When an atom absorbs the source x-rays, the incident radiation <br /> dislodges electrons from the innermost shells of the atom, creating vacancies. The electron <br /> vacancies are filled by electrons cascading in from outer electron shells. Electrons in outer shells <br /> have higher energy states than inner shell electrons, and the outer shell electrons give off energy <br /> as they cascade down into the inner shell vacancies. This rearrangement of electrons results in <br /> emission of x-rays characteristic of the given atom. The emission of x-rays, in this manner, is termed <br /> x-ray fluorescence. <br /> CD-ROM 6200 - 1 Revision 0 <br /> January 1998 <br />
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