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Three electron shells are generally involved in emission of x-rays during FPXRF analysis of <br /> environmental samples: the K, L, and M shells. A typical emission pattern, also called an emission <br /> spectrum, for a given metal has multiple intensity peaks generated from the emission of K, L, or M <br /> shell electrons. The most commonly measured x-ray emissions are from the K and L shells; only <br /> metals with an atomic number greater than 57 have measurable M shell emissions. <br /> Each characteristic x-ray line is defined with the letter K, L, or M, which signifies which shell <br /> had the original vacancy and by a subscript alpha (a) or beta ((3), which indicates the higher shell <br /> from which electrons fell to fill the vacancy and produce the x-ray. For example, a KQ line is <br /> produced by a vacancy in the K shell filled by an L shell electron, whereas a Kp line is produced by <br /> a vacancy in the K shell filled by an M shell electron. The KQ transition is on average 6 to 7 times <br /> more probable than the Ka transition; therefore, the K,, line is approximately 7 times more intense <br /> than the Kp line for a given element, making the KQ line the choice for quantitation purposes. <br /> The K lines for a given element are the most energetic lines and are the preferred lines for <br /> analysis. For a given atom, the x-rays emitted from L transitions are always less energetic than <br /> those emitted from K transitions. Unlike the K lines, the main L emission lines (LQ and Lp) for an <br /> element are of nearly equal intensity. The choice of one or the other depends on what interfering <br /> element lines might be present. The L emission lines are useful for analyses involving elements of <br /> atomic number (Z) 58 (cerium) through 92 (uranium). <br /> An x-ray source can excite characteristic x-rays from an element only if the source energy is <br /> greater than the absorption edge energy for the particular line group of the element, that is, the K <br /> absorption edge, L absorption edge, or M absorption edge energy. The absorption edge energy is <br /> somewhat greater than the corresponding line energy. Actually, the K absorption edge energy is <br /> approximately the sum of the K, L, and M line energies of the particular element, and the L <br /> absorption edge energy is approximately the sum of the L and M line energies. FPXRF is more <br /> sensitive to an element with an absorption edge energy close to but less than the excitation energy <br /> of the source. For example, when using a cadmium-109 source, which has an excitation energy of <br /> 22.1 kiloelectron volts (keV), FPXRF would exhibit better sensitivity for zirconium which has a K line <br /> energy of 15.7 keV than to chromium, which has a K line energy of 5.41 keV. <br /> 2.2 Under this method, inorganic analytes of interest are identified and quantitated using <br /> a field portable energy-dispersive x-ray fluorescence spectrometer. Radiation from one or more <br /> radioisotope sources or an electrically excited x-ray tube is used to generate characteristic x-ray <br /> emissions from elements in a sample. Up to three sources may be used to irradiate a sample. Each <br /> source emits a specific set of primary x-rays that excite a corresponding range of elements in a <br /> sample. When more than one source can excite the element of interest, the source is selected <br /> according to its excitation efficiency for the element of interest. <br /> For measurement, the sample is positioned in front of the probe window. This can be done <br /> in two manners using FPXRF instruments: in situ or intrusive. If operated in the in situ mode, the <br /> probe window is placed in direct contact with the soil surface to be analyzed. When an FPXRF <br /> instrument is operated in the intrusive mode, a soil or sediment sample must be collected, prepared, <br /> and placed in a sample cup. The sample cup is then placed on top of the window inside a protective <br /> cover for analysis. <br /> Sample analysis is then initiated by exposing the sample to primary radiation from the source. <br /> Fluorescent and backscattered x-rays from the sample enter through the detector window and are <br /> converted into electric pulses in the detector. The detector in FPXRF instruments is usually either <br /> a solid-state detector or a gas-filled proportional counter. Within the detector, energies of the <br /> characteristic x-rays are converted into a train of electric pulses, the amplitudes of which are linearly <br /> CD-ROM 6200 - 2 Revision 0 <br /> January 1998 <br />